Delay fault testing for VLSI circuits
Material type:
TextPublication details: Kluwer academic 1998 BostonDescription: 191 pISBN: - 9780792382959
- 621.395 K929d
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
REF
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Central Library Reference | Electronic and Communication | 621.395 K929d (Browse shelf(Opens below)) | Available | 14240 |
Total holds: 0
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