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Advanced VLSI design and testability issues

Tripathi, Suman Lata

Advanced VLSI design and testability issues - Boca Raton CRC Press 2021 - xvii, 359p.

ISBN: 9780367538361

Subjects--Topical Terms:
Integrated circuits--very large scale integration
Technology--Design and construction

Dewey Class. No.: 621.395 T7374a

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Advanced VLSI design and testability issues

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