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Digital systems testing and testable design

Abramovici, Miron

Digital systems testing and testable design Miron Abramovici - Mumbai Jaico Publishing House 2004 - xviii, 652p.

ISBN: 9788172248918

Subjects--Topical Terms:
Digital integrated circuits--Design and construction
Digital integrated circuits--Testing

Dewey Class. No.: 621.3815 Ab832d

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Digital systems testing and testable design

Welcome to LNMIIT Central Library
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