Mahesh M. Rathore <br/><br/>
CMOS SRAM circuit design and parametric test in nano-scaled technologies   : process-aware SRAM design and test 
by Pavlov, Andrei, Ph. D 
 - New Delhi  Springer (India)  2011 
 - xvi, 193p. 
<br/><br/><label>ISBN: </label>9788132202325 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Metal oxide semiconductors--Complementary--Design<br/>Random access memory<br/>Nanoelectronics
<br/><br/><label>Dewey Class. No.: </label>621.39 P2893c