Sharma, Ashok K.  <br/><br/>
Semiconductor memories  technology, testing, and reliability 
Ashok K. Sharma 
 - New Delhi  Wiley India  1997 
 - xii, 460p. 
 - IEEE Press .
 - Anderson, John B.  .
<br/><br/><label>ISBN: </label>9788126548378 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Semiconductor storage devices
<br/><br/><label>Dewey Class. No.: </label>621.39732 Sh233s