TY  - BOOK
AU  - Sharma, Ashok K. 
TI  - Semiconductor memories: technology, testing, and reliability
T2  - Anderson, John B. 
SN  - 9788126548378
U1  - 621.39732 Sh233s 
PY  - 1997///
CY  - New Delhi
PB  - Wiley India
KW  - Semiconductor storage devices
ER  -