Angela Krstic <br/><br/>
Delay fault testing for VLSI circuits 

 - Boston  Kluwer academic  1998 
 - 191 p. 
<br/><br/><label>ISBN: </label>9780792382959 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Electrical EngineeringDelay faults (Semiconductors); Integrated circuits--Very large scale integration--Testing; Computer engineering
<br/><br/><label>Dewey Class. No.: </label>621.395  / K929d