TY  - BOOK
AU  - Angela Krstic
TI  - Delay fault testing for VLSI circuits
SN  - 9780792382959
U1  - 621.395 
PY  - 1998///
CY  - Boston
PB  - Kluwer academic
KW  - Electrical EngineeringDelay faults (Semiconductors); Integrated circuits--Very large scale integration--Testing; Computer engineering
ER  -