TY  - BOOK
AU  - Bushnell, Michael L. 
AU  -  Agrawal, Vishwani D
AU  - Bushnell, Michael L
TI  - Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits
SN  - 9788132233299
U1  - 621.395 B9641e 
PY  - 2000///
CY  - New Delhi
PB  - Springer (India)
KW  - Mixed signal circuits--Testing
KW  - Semiconductor storage devices--Testing
KW  - Digital integrated circuits--Testing
ER  -