TY  - BOOK
AU  - Wu, Yung-Chun 
AU  - Jhan, Yi-Ruei 
TI  - 3D TCAD simulation for CMOS nanoeletronic devices  
SN  - 9789811030659
U1  - 621.38152 W9501t 
PY  - 2018///
CY  - Singapore
PB  - Springer
KW  - Metal oxide semiconductors
KW  - Microelectronic
KW  - Nanotechnology
ER  -