Tripathi, Suman Lata <br/><br/>
Advanced VLSI design and testability issues 

 - Boca Raton  CRC Press  2021 
 - xvii, 359p. 
<br/><br/><label>ISBN: </label>9780367538361 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Integrated circuits--very large scale integration<br/>Technology--Design and construction 
<br/><br/><label>Dewey Class. No.: </label>621.395 T7374a