TY  - BOOK
AU  - Tripathi, Suman Lata
AU  - Saxena, Sobhit
AU  - Mohapatra, Sushanta Kumar
TI  - Advanced VLSI design and testability issues
SN  - 9780367538361
U1  - 621.395 T7374a 
PY  - 2021///
CY  - Boca Raton
PB  - CRC Press
KW  - Integrated circuits
KW  - very large scale integration
KW  - Technology
KW  - Design and construction
ER  -