TY  - GEN
AU  - Holt, D.B.
AU  - Yacobi, B.G.
TI  - Extended defects in semiconductors: electronic properties, device effects and structures
SN  - 9780521819343
U1  - 621.38152 H7422e 
PY  - 2007///
CY  - New York
PB  - Cambridge University Press
KW  - Semiconductors
KW  - Defects
KW  - Electronic properties
ER  -