Hagar, Jon Duncan  <br/><br/>
IOT system testing:  an IOT journey from devices to analytics and the edge  

 - New York   Apress  2022 
 - xix, 326p. 
<br/><br/><label>ISBN: </label>9781484291146 
<br/><br/><label>Subjects--Topical Terms: </label><br/>IOT technology <br/>Computer science 
<br/><br/><label>Dewey Class. No.: </label>005.8 H1205i