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1.
CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Pavlov, Andrei, Ph. D by
Material type: Text Text
Language: English
Publication details: New Delhi Springer (India) 2011
Availability: Items available for loan: Central Library (1)Call number: 621.39 P2893c.

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2.
Thermal engineering by
Material type: Text Text
Publication details: New Delhi Tata McGraw-Hill 2013
Availability: Items available for loan: Central Library (1)Call number: 621.402 R188t.

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