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1.
Digital systems testing and testable design Miron Abramovici by
Material type: Text Text
Language: English
Publication details: Mumbai Jaico Publishing House 2004
Availability: Items available for loan: Central Library (1)Call number: 621.3815 Ab832d .

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2.
Digital system test and testable design using HDL models and architectures Zainalabedin Navabi by
Material type: Text Text
Language: English
Publication details: New Delhi Springer 2011
Availability: Items available for loan: Central Library (1)Call number: 621.3815 N2271d.

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3.
Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits Michael L. Bushnell by
Material type: Text Text
Language: English
Publication details: New Delhi Springer (India) 2000
Availability: Not available: Central Library: Checked out (1).

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