| 000 | 00547nam a2200193Ia 4500 | ||
|---|---|---|---|
| 999 |
_c13859 _d13859 |
||
| 005 | 20210510112832.0 | ||
| 008 | 170527s2016||||xx |||||||||||||| ||und|| | ||
| 020 | _a9788126548378 | ||
| 041 | _aeng | ||
| 082 | _a621.39732 Sh233s | ||
| 100 | _aSharma, Ashok K. | ||
| 245 | 0 |
_aSemiconductor memories _btechnology, testing, and reliability _cAshok K. Sharma |
|
| 260 |
_aNew Delhi _bWiley India _c1997 |
||
| 300 | _axii, 460p. | ||
| 440 | _aIEEE Press | ||
| 490 | _aAnderson, John B. | ||
| 650 | _aSemiconductor storage devices | ||
| 942 | _cBK | ||