| 000 | 00703nam a2200217Ia 4500 | ||
|---|---|---|---|
| 999 |
_c14528 _d14528 |
||
| 005 | 20210910153134.0 | ||
| 008 | 170527s2016||||xx |||||||||||||| ||und|| | ||
| 020 | _a9788132233299 | ||
| 041 | _aeng | ||
| 082 | _a621.395 B9641e | ||
| 100 | _aBushnell, Michael L. | ||
| 245 | 0 |
_aEssentials of electronic testing for digital, memory, and mixed-signal VLSI circuits _cMichael L. Bushnell |
|
| 260 |
_bSpringer (India) _c2000 _aNew Delhi |
||
| 300 | _axvii, 690p. | ||
| 650 | _aMixed signal circuits--Testing | ||
| 650 | _aSemiconductor storage devices--Testing | ||
| 650 | _aDigital integrated circuits--Testing | ||
| 700 | _a Agrawal, Vishwani D | ||
| 700 | _aBushnell, Michael L | ||
| 942 | _cBK | ||