000 00460nam a2200169Ia 4500
008 240206s9999||||xx |||||||||||||| ||und||
020 _a9780262256186
040 _aLNMIIT
100 _aFujiwara
245 0 _aLogic Testing and Design for Testability
260 _bMIT Press
_c1985
500 _afulltext
520 _aMonograph
650 _aComputing and Processing
856 _uhttps://ieeexplore.ieee.org/servlet/opac?bknumber=6267264
942 _cEB
999 _c27386
_d27386