000 | 00622nam a2200205Ia 4500 | ||
---|---|---|---|
999 |
_c3105 _d3105 |
||
005 | 20210427115126.0 | ||
008 | 170527s2016||||xx |||||||||||||| ||und|| | ||
020 | _a9788172248918 | ||
041 | _aeng | ||
082 | _a621.3815 Ab832d | ||
100 | _aAbramovici, Miron | ||
245 | 0 |
_aDigital systems testing and testable design _cMiron Abramovici |
|
260 |
_aMumbai _bJaico Publishing House _c2004 |
||
300 | _axviii, 652p. | ||
650 |
_aDigital integrated circuits _xDesign and construction |
||
650 |
_aDigital integrated circuits _xTesting |
||
700 | _aBreuer, Melvin A. | ||
700 | _aFriedman, Arthur D. | ||
942 | _cBK |