000 00622nam a2200205Ia 4500
999 _c3105
_d3105
005 20210427115126.0
008 170527s2016||||xx |||||||||||||| ||und||
020 _a9788172248918
041 _aeng
082 _a621.3815 Ab832d
100 _aAbramovici, Miron
245 0 _aDigital systems testing and testable design
_cMiron Abramovici
260 _aMumbai
_bJaico Publishing House
_c2004
300 _axviii, 652p.
650 _aDigital integrated circuits
_xDesign and construction
650 _aDigital integrated circuits
_xTesting
700 _aBreuer, Melvin A.
700 _aFriedman, Arthur D.
942 _cBK