CMOS SRAM circuit design and parametric test in nano-scaled technologies : process-aware SRAM design and test by Pavlov, Andrei, Ph. D
Material type:
TextLanguage: English Publication details: Springer (India) 2011 New DelhiDescription: xvi, 193pISBN: - 9788132202325
- 621.39 P2893c
| Item type | Current library | Collection | Call number | Status | Date due | Barcode | Item holds | |
|---|---|---|---|---|---|---|---|---|
Text Book
|
Central Library | Electronic and Communication | 621.39 P2893c (Browse shelf(Opens below)) | Available | 12892 |
Total holds: 0
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